CCD Measurement System
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7-CRD
Used for quantitative measurements on electro-optical system
Our CCD measurement system, also known as CCD imaging electronics test equipment for quantitative photoelectric testing, is essential for assessing optoelectronic performance. It addresses critical needs in the development of space optical remote sensors, aiding in the selection of photoelectric imaging devices and providing solutions for radiation hardening and correction. By enabling testing measures and delving into the mechanisms behind performance changes post-radiation exposure, it tackles numerous scientific challenges. Furthermore, in the industry, it plays a pivotal role in evaluating and standardizing the anti-radiation performance of photoelectric imaging devices, promoting advancements and standardization.
Specifications
Working spectral bands | 380nm to 1100nm |
Spectral resolution | 20nm to 40nm |
A/D quantization grade | 14-bit |
Dynamic range | ≥80dB |
Measurement uncertainty of absolute value | Less than 8% |
Repeatability error | Not more than 3%. |
Test Contents
- Saturation Output Voltage (SV)
- Saturation Exposure (SE)
- Relative Spectral Responsivity (RS)
- Response No uniformity (PRNU)
- Charge Transfer Efficiency (CTE)
- Dark Signal (DS)
- Dark Noise (VNOISE)
- Noise Equivalent Exposure (NEE)
- Dynamic Range (DR)
- Nonlinearity (NL)
- Fixed-Pattern Noise (FPN)
- Transfer Function of Spectrum and White Light (MTF)
- Light Radiation Response (R, under lamp illumination)
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