Quantum Efficiency / IPCE Measurement System
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7-SCSpec
Used to measure solar cell spectral response, IQE and IPCE for photovoltaic devices
The 7-SCSpec utilizes a modular concept, allowing the testing system to be configured according to users' specific requirements. It is capable of testing spectral response, spectral reflectance, internal quantum efficiency (IQE) or monochromatic incident photon-to-electron conversion efficiency (IPCE), spectral transmissivity, and short-circuit current density for various types of cells, including thin-film solar cells with single junctions, double junctions, and multi-junctions of monocrystalline or polycrystalline silicon.
Measurements Included
- Absolute spectral response
- Absolute spectral reflectance
- Internal/external quantum efficiency
- Spectral transmissivity
- Short-circuit current density, etc.
Features
- Modular design ensures customization according to user needs, providing economic flexibility and wide applicability. It offers convenient upgrades, renovations, and maintenance.
- Options include high-power halogen tungsten lamps and xenon lamps, as well as customizable light sources chosen by users or specified sources.
- The unique splitting system guarantees excellent wavelength accuracy and repeatability, eliminating the influence of multi-spectra and minimizing stray light.
- Enhanced weak signal processing capabilities effectively improve the signal-to-noise ratio, ensuring precise measurement.
- Various sample holders are available for selection, offering convenient clamping, excellent electrode contact, and minimal interference during weak signal testing.
- Developed independently, the high-performance weak signal processor is equipped with an imported DC signal pre-amplifier. It effectively isolates DC components caused by polarized sample illumination and facilitates automatic control signal switching.
Specifications
| Spectrum range | 200-2500nm (optional) |
| Scanning interval | ≥1nm (adjustable integer) |
| Scanning mode | Fully automatic operation |
| Configurable with two bias light sources, convenient for testing thin film solar cells with over 3 junctions | |
| Bias filters | Seven pieces, including two short-wave pass (imported) and four long-wave pass |
| Repeatability of short-circuit current density | < 0.1%-0.5% (slightly varies depending on the light source and spectral range) |
| Working table with optional temperature control | Temperature range of 5-40 ℃ (± 0.5 ℃) |
| Test methods | AC, DC (optional) |
| Optional three automatic shutters, each controlling the main light and the opening and closing of two polarization switches | |
| Choice of a double-grating monochromator | |
| Optional dual light path monitoring | |
Measuring Curves
Spectral response curve measured in real time for the silicon solar cells
Spectral reflectance curve measured in real time for the silicon solar cells
External quantum efficiency curve measured in real time for the silicon solar cells
Internal quantum efficiency curve measured in real time for the silicon solar cells
The quantum efficiency curve measured in real time for solar cells with dual junction
Quantum efficiency curve measured in real time for solar cells with three junctions
The quantum efficiency curve measured in real time for dye-sensitized solar cells
The spectral response curve measured in real time for dye-sensitized solar cells
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