LH6216 Integrated Circuit IC Dynamic Aging Test System

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Combined environmental testing solutions for testing batteries

The integrated circuit dynamic aging test system is specifically developed to assess the reliability of IC chips while operating under realistic working conditions. It recreates combined stress factors such as fluctuating temperatures, variable voltages, and diverse frequencies to reflect actual usage scenarios. Throughout extended testing cycles, this environmental chamber records performance trends and identifies potential failure points that may arise over time.

This testing approach has become essential as integrated circuits are now critical components in areas ranging from consumer electronics and automotive electronics to telecommunications, industrial automation, and aerospace. As expectations for performance and service life continue to rise, thorough reliability evaluations have become a key part of ensuring consistent product quality and safety.

Features

Capable of testing across the full voltage amplitude range with a maximum rate of up to 33 MHz, meeting demanding performance verification requirements.
Equipped with a built-in oscilloscope that delivers high-speed, high-precision waveform sampling, helping engineers capture subtle signal variations during dynamic aging tests.
Supports micro-instruction-based pattern configurations with flexible formats and expandable depth, allowing complex test scenarios to be created and adjusted efficiently.
Utilizes a database-driven software architecture that safely stores all data, ensuring no loss of test records even in the event of power interruptions.

Advantages

Reliable simulation of real operating conditions
The integrated circuit dynamic aging test system recreates authentic working scenarios for IC chips, considering dynamic factors such as varying clock frequencies and shifting input/output signals during operation.
By accurately controlling the temperature and voltage throughout the process, this setup accelerates the natural aging of components, making it possible to observe long-term degradation effects in a shorter timeframe.
Comprehensive fault detection
While the chips operate under dynamic conditions, the equipment continuously monitors parameters like power consumption, signal integrity, and electrical noise. This capability helps detect intermittent issues that often remain hidden in conventional static tests.
It also identifies potential failures caused by repeated thermal cycle such as loose contacts or solder fatigue, allowing manufacturers to catch problems early and improve product reliability before deployment.
Precise environmental control and monitoring
The chamber integrates advanced systems to maintain stable temperature, humidity, and voltage, while embedded sensors provide continuous feedback and record detailed data throughout each test.
These capabilities enable the creation of comprehensive aging profiles, supporting design refinement and manufacturing improvements. For example, analyzing the performance of multiple batches under identical conditions can reveal inconsistencies or weaknesses in production processes.
Flexible testing configurations
The aging test system can be customized to suit different chip technologies, application areas, or process nodes. Test parameters, including voltage levels, frequency ranges, and cycle durations, can be tailored to match specific requirements.
Multiple chips can be tested simultaneously, streamlining workflows and reducing costs. This makes our aging test chamber suitable for large-scale production environments, such as consumer electronics, automotive electronics, and telecom equipment.

Technical Parameters

Test system	System type	Integrated circuit IC dynamic aging test system
	Model	LH6216
	Standard	MIL-STD-883D, MIL-M-38510, GJB548, GJB597
	Dimensions	W130cm×D140cm×H195cm
	Power supply	AC380V±5%, 50Hz
	Power	≤21kW
Temperature test chamber	Temperature range	(ambient temperature 20)℃~ 150℃
Temperature test chamber	Temperature deviation/fluctuation	150℃±2.0℃(no-load)/±0.5℃
Test DC power supply	Channels	Each channel provides 4 power supplies. · Vcc: Chip operating power supply · Vmux: Load power supply · Vclk: Signal amplitude adjustment power supply · Vee: Negative operating voltage supply
	Voltage range	0~18V
	Current range	0~10A
	Max. power	100W
Digital signal	Number of channels	Each driver and measurement module provides 64 independent high-frequency digital signals, with each signal output independently in tri-state mode
	Programmable step length setting	30ns~0.4s
	Programmable depth	8Mbit